Title :
Pragmatic study of parametric decomposition models for estimating software reliability growth
Author :
Huang, Chin-Yu ; Lo, Jung-Hua ; Kuo, Sy-Yen
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
Numerous stochastic models for the software failure phenomenon based on Nonhomogeneous Poisson Process (NHPP) have been proposed in the last three decades (1968-98). Although these models are quite helpful for software developers and have been widely applied at industrial organizations or research centers, we still need to do more work on examining/estimating the parameters of existing software reliability growth models (SRGMs). We investigate and account for three possible trends of software fault detection phenomena during the testing phase: increasing, decreasing and steady state. We present empirical results from quantitative studies on evaluating the fault detection process and develop a valid time-variable fault detection rate model which has the inherent flexibility of capturing a wide range of possible fault detection trends. The applicability of the proposed model and the related methods of parametric decomposition are illustrated through several real data sets from different software projects. Our evaluation results show that the analytic parametric decomposition approach for SRGM have a fairly accurate prediction capability. In addition, the testing effort control problem based on the proposed model is also demonstrated
Keywords :
program testing; software metrics; software performance evaluation; software reliability; Nonhomogeneous Poisson Process; SRGM; accurate prediction capability; analytic parametric decomposition approach; fault detection process; fault detection trends; industrial organizations; parametric decomposition; parametric decomposition models; pragmatic study; proposed model; quantitative studies; real data sets; research centers; software developers; software failure phenomenon; software fault detection phenomena; software projects; software reliability growth estimation; software reliability growth models; stochastic models; testing effort control problem; testing phase; valid time-variable fault detection rate model; Electrical capacitance tomography; Fault detection; Logistics; Parameter estimation; Power system modeling; Predictive models; Programming; Software reliability; Software systems; Software testing;
Conference_Titel :
Software Reliability Engineering, 1998. Proceedings. The Ninth International Symposium on
Conference_Location :
Paderborn
Print_ISBN :
0-8186-8991-9
DOI :
10.1109/ISSRE.1998.730861