DocumentCode :
3308471
Title :
Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier
Author :
Beurze, R.H. ; Xing, Y. ; van Kleef, R. ; Tangelder, R.J.W.T. ; Engin, N.
Author_Institution :
Twente Univ., Enschede, Netherlands
fYear :
1999
fDate :
25-28 May 1999
Firstpage :
28
Lastpage :
33
Abstract :
This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage.
Keywords :
BiCMOS analogue integrated circuits; audio-frequency amplifiers; automatic testing; built-in self test; design for testability; fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; power amplifiers; production testing; BiCMOS/DMOS process; DOTSS software tool; PWM amplifier; behavioral modeling; defect-oriented test simulation system; defect-oriented testing; design-for-testability; deterministic fault extraction; fault simulations; high fault coverage; industrial test development; mixed-signal class-D amplifier; practical implementation; underlying fault mechanisms; Circuit faults; Circuit testing; High power amplifiers; Integrated circuit testing; Niobium; Power amplifiers; Power generation; Pulse amplifiers; Semiconductor device testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Test Workshop 1999. Proceedings
Conference_Location :
Constance, Germany
Print_ISBN :
0-7695-0390-X
Type :
conf
DOI :
10.1109/ETW.1999.804205
Filename :
804205
Link To Document :
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