Title :
A new approach for the nonlinearity test of ADCs/DACs and its application for BIST
Author_Institution :
Inst. fur Theor. Elektrotech., Hannover Univ., Germany
Abstract :
This paper describes an algorithm to derive the nonlinearity performances of Analog-to-Digital and Digital-to-Analog Converters (ADCs/DACs) from FFT results. The main advantages of the new approach over conventional ones are that the test stimuli are simpler and the influence of noise on test results decreases. This method is especially useful for the BIST of converters. Experiments have shown the feasibility of this approach.
Keywords :
analogue-digital conversion; built-in self test; digital-analogue conversion; fast Fourier transforms; frequency-domain analysis; harmonic distortion; ADC; BIST; DAC; FFT results; decreased noise influence; frequency domain test; harmonic distortion; mixed signal tester; nonlinearity performance; nonlinearity test algorithm; sine wave stimuli; Analog-digital conversion; Built-in self-test; Digital signal processing; Frequency domain analysis; Linearity; Performance evaluation; Signal generators; Signal resolution; Signal sampling; Testing;
Conference_Titel :
European Test Workshop 1999. Proceedings
Conference_Location :
Constance, Germany
Print_ISBN :
0-7695-0390-X
DOI :
10.1109/ETW.1999.804206
