• DocumentCode
    3308576
  • Title

    A standoff system for noncooperative ocular biometrics

  • Author

    Doynov, P. ; Derakhshani, R.

  • Author_Institution
    Dept. of Comput. Sci. Electr. Eng., Univ. of Missouri at Kansas City, Kansas City, MO, USA
  • fYear
    2012
  • fDate
    13-15 Nov. 2012
  • Firstpage
    144
  • Lastpage
    149
  • Abstract
    The iris and more recently vascular patterns seen on the white of the eye have been considered for ocular biometrics. The non-contact nature, uniqueness, and permanence of ocular features makes them promising. Among new challenges are to develop commercial systems for less constrained environments and at extended distances. Such systems need to have minimal burden on the user and be robust for non-cooperative users. We present the design and development of standoff system for noncooperative ocular biometrics using system integration approach. Review of existing commercial and experimental long-range biometric systems is presented. The process of selection of sensors and illumination techniques is described. The development of user interfaces and algorithms for a working prototype is explained. The performance is evaluated with images of 28 subjects, acquired at distances up to 9 meters. The conflicting requirements for the design of this standoff biometric system, and the resulting performance limitations with impact on image quality are discussed.
  • Keywords
    eye; feature extraction; iris recognition; user interfaces; eye; illumination technique; image quality; iris pattern; long-range biometric system; noncontact nature; noncooperative ocular biometrics; ocular feature permanence; ocular feature uniqueness; sensor selection; standoff system; system integration; user interface development; vascular pattern; Cameras; Image resolution; Iris recognition; Lenses; Lighting; Noncooperative biometrics; Ocular biometrics; Standoff biometric system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Homeland Security (HST), 2012 IEEE Conference on Technologies for
  • Conference_Location
    Waltham, MA
  • Print_ISBN
    978-1-4673-2708-4
  • Type

    conf

  • DOI
    10.1109/THS.2012.6459840
  • Filename
    6459840