• DocumentCode
    3308579
  • Title

    Reliability Prediction Method Based on Function and Fault Reasoning for Electronic Products

  • Author

    Guangyan, Zhao ; Yufeng, Sun ; Gang, Zhao ; Weiwei, Hu

  • Author_Institution
    Sch. of Reliability & Syst. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
  • fYear
    2010
  • fDate
    13-19 June 2010
  • Firstpage
    55
  • Lastpage
    60
  • Abstract
    In respect of the lack of suitable method of mission reliability prediction for complex product, this paper puts forward a method of mission reliability prediction for circuit based on function simulation and fault reasoning. It builds the topology reasoning model and function simulation model of circuit with the aid of existing mature EDA (Electronic Design Automation) simulation tool, simulates and analyzes hard fault and soft fault of the components composed of circuit separately, and achieves the response of components failure on circuit. Then the idea of Monte Carlo simulation is used to carry on statistical analysis of fault data and calculate the circuit mission reliability. This paper presents the basic idea of this method, expatiates the principle and techniques of circuit functional fault simulation and circuit fault reasoning. Finally, this paper analyzed a representative case using the method mentioned in the paper. It does not need to build product’s reliability model using this method. Automatic reliability prediction could be realized in the same time with circuit design, which provides huge advantage to circuit designer. This paper makes exploratory researches on the method of integrated prediction of performance and reliability, and it is a strong complement to the existing reliability prediction method.
  • Keywords
    Analytical models; Circuit faults; Circuit simulation; Circuit topology; Electronic design automation and methodology; Failure analysis; Integrated circuit reliability; Prediction methods; Predictive models; Statistical analysis; EDA; circuit; fault reasoning; fault simulation; reliability prediction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communication Theory, Reliability, and Quality of Service (CTRQ), 2010 Third International Conference on
  • Conference_Location
    Athens, TBD, Greece
  • Print_ISBN
    978-1-4244-7273-4
  • Type

    conf

  • DOI
    10.1109/CTRQ.2010.17
  • Filename
    5532787