Title :
Reliability Prediction Method Based on Function and Fault Reasoning for Electronic Products
Author :
Guangyan, Zhao ; Yufeng, Sun ; Gang, Zhao ; Weiwei, Hu
Author_Institution :
Sch. of Reliability & Syst. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Abstract :
In respect of the lack of suitable method of mission reliability prediction for complex product, this paper puts forward a method of mission reliability prediction for circuit based on function simulation and fault reasoning. It builds the topology reasoning model and function simulation model of circuit with the aid of existing mature EDA (Electronic Design Automation) simulation tool, simulates and analyzes hard fault and soft fault of the components composed of circuit separately, and achieves the response of components failure on circuit. Then the idea of Monte Carlo simulation is used to carry on statistical analysis of fault data and calculate the circuit mission reliability. This paper presents the basic idea of this method, expatiates the principle and techniques of circuit functional fault simulation and circuit fault reasoning. Finally, this paper analyzed a representative case using the method mentioned in the paper. It does not need to build product’s reliability model using this method. Automatic reliability prediction could be realized in the same time with circuit design, which provides huge advantage to circuit designer. This paper makes exploratory researches on the method of integrated prediction of performance and reliability, and it is a strong complement to the existing reliability prediction method.
Keywords :
Analytical models; Circuit faults; Circuit simulation; Circuit topology; Electronic design automation and methodology; Failure analysis; Integrated circuit reliability; Prediction methods; Predictive models; Statistical analysis; EDA; circuit; fault reasoning; fault simulation; reliability prediction;
Conference_Titel :
Communication Theory, Reliability, and Quality of Service (CTRQ), 2010 Third International Conference on
Conference_Location :
Athens, TBD, Greece
Print_ISBN :
978-1-4244-7273-4
DOI :
10.1109/CTRQ.2010.17