Experimental results on BIC sensors for transient current testing

Author

Picos, R. ; Roca, M. ; Isern, E. ; Segura, J. ; García-Moreno, E.

Author_Institution

Univ. of the Balearic Islands, Palma de Mallorca, Spain

fYear

1999

fDate

25-28 May 1999

Firstpage

46

Lastpage

50

Abstract

In this work experimental results on a built in current sensor for dynamic current testing, i/sub ddt/, based on integration concepts are presented. The experimental validation proposed in this work is done through a VLSI CMOS circuit implemented in a 0.7 micron technology. Different experiences have been developed analyzing the detectability of several kind of defects through this technique. The encouraging results obtained present this technique as an attractive complement to boolean and I/sub DDQ/ testing.

Keywords

CMOS analogue integrated circuits; VLSI; built-in self test; current mirrors; electric current measurement; integrating circuits; logic testing; operational amplifiers; 0.7 micron; VLSI CMOS circuit; built in current sensor; current integrator; current mirror; defects detectability; dynamic current testing; feedback capacitor; integration concepts; op amp; transient current testing; transient power current consumption; CMOS technology; Circuit testing; Integrated circuit testing; Logic testing; Microelectronics; Physics; Transistors; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

European Test Workshop 1999. Proceedings

Conference_Location

Constance, Germany

Print_ISBN

0-7695-0390-X

Type

conf

DOI

10.1109/ETW.1999.804215

Filename

804215