Title :
The story behind the red phosphorus mold compound device failures
Author :
Deng, Yuliang ; Pecht, Michael
Author_Institution :
Dept. of Mech. Eng., Maryland Univ., College Park, MD, USA
Abstract :
A family of mold compounds with red phosphorus flame retardant was introduced as an environmentally-friendly encapsulant for semiconductor devices. However, these mold compounds introduced product failures, including current leakage and resistive shorts between adjacent leads inside the leaded semiconductor device package, and resistance increases and open circuits of the wire bonds. This paper presents the family of mold compounds with the red phosphorus flame retardant, the failure mechanisms and the root cause of the failures.
Keywords :
encapsulation; failure analysis; flame retardants; leakage currents; moulding; phosphorus; semiconductor device packaging; semiconductor device reliability; current leakage; device failures; environmental friendly encapsulant; open circuits; product failure; red phosphorus flame retardant; red phosphorus mold compound; resistive shorts; semiconductor device package; wire bonds; Aluminum; Coatings; Curing; Flame retardants; Lead compounds; Mechanical engineering; Packaging; Resins; Semiconductor devices; Wire;
Conference_Titel :
Electronics Materials and Packaging, 2005. EMAP 2005. International Symposium on
Print_ISBN :
1-4244-0107-0
DOI :
10.1109/EMAP.2005.1598224