• DocumentCode
    3308664
  • Title

    The story behind the red phosphorus mold compound device failures

  • Author

    Deng, Yuliang ; Pecht, Michael

  • Author_Institution
    Dept. of Mech. Eng., Maryland Univ., College Park, MD, USA
  • fYear
    2005
  • fDate
    11-14 Dec. 2005
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A family of mold compounds with red phosphorus flame retardant was introduced as an environmentally-friendly encapsulant for semiconductor devices. However, these mold compounds introduced product failures, including current leakage and resistive shorts between adjacent leads inside the leaded semiconductor device package, and resistance increases and open circuits of the wire bonds. This paper presents the family of mold compounds with the red phosphorus flame retardant, the failure mechanisms and the root cause of the failures.
  • Keywords
    encapsulation; failure analysis; flame retardants; leakage currents; moulding; phosphorus; semiconductor device packaging; semiconductor device reliability; current leakage; device failures; environmental friendly encapsulant; open circuits; product failure; red phosphorus flame retardant; red phosphorus mold compound; resistive shorts; semiconductor device package; wire bonds; Aluminum; Coatings; Curing; Flame retardants; Lead compounds; Mechanical engineering; Packaging; Resins; Semiconductor devices; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Materials and Packaging, 2005. EMAP 2005. International Symposium on
  • Print_ISBN
    1-4244-0107-0
  • Type

    conf

  • DOI
    10.1109/EMAP.2005.1598224
  • Filename
    1598224