DocumentCode
3308672
Title
Semiconductor integrated circuit packaging technology challenges - next five years
Author
Bolanos, Mario A.
Author_Institution
Texas Instruments Inc., Dallas, TX, USA
fYear
2005
fDate
11-14 Dec. 2005
Firstpage
6
Lastpage
9
Abstract
This paper addresses many of the IC packaging technology challenges that need to be addressed during the next five years. This is the era of communications. consumer products are driving the majority of the electronics industry growth in the next decade; these products generally prioritize power over performance. Electronic products used in automotive applications are also showing steady growth rate. This trend combined with the proliferation of other electronic end equipments has resulted in a large diversity of new IC package types, each designed to meet a specific application or market. The introduction of advanced CMOS processes, with copper interconnect and ultra-low-k dielectrics, is also presenting major challenges from a silicon-packaging integration perspective. This is resulting in new requirements for up-front development and collaboration between package engineers and IC process development organizations. The emergence of system on chip, SoC, and system in package, SiP, is driving more complexity, functionality, and heterogeneous technology integration. Power has become a key technology hurdle, both at the silicon level, as well as at the packaging and system level. Thermal challenges are driving non traditional thermal management solutions. The increased complexity in many of these package families, combined with reduced time to market requirements, has created a need for automated package and chip co-design methodologies to achieve optimum electrical and mechanical reliability performance in final products.
Keywords
electronics industry; integrated circuit packaging; integrated circuit reliability; system-in-package; system-on-chip; technological forecasting; thermal management (packaging); time to market; advanced CMOS process; copper interconnects; electrical reliability; electronic products; electronics industry; low-k dielectrics; mechanical reliability; semiconductor integrated circuit packaging; silicon-packaging integration; system in package; system on chip; technology integration; thermal management; Application specific integrated circuits; Automotive applications; Consumer electronics; Consumer products; Electronic packaging thermal management; Electronics industry; Electronics packaging; Integrated circuit packaging; Integrated circuit technology; Thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Materials and Packaging, 2005. EMAP 2005. International Symposium on
Print_ISBN
1-4244-0107-0
Type
conf
DOI
10.1109/EMAP.2005.1598225
Filename
1598225
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