Title :
Improved binarization algorithm for document image by histogram and edge detection
Author :
Chang, Moon-Soo ; Kang, Sun-mee ; Rho, Woo-Sik ; Kim, Heok-Gu ; Kim, Duck-jin
Author_Institution :
Dept. of Electron. Eng., Korea Univ., Seoul, South Korea
Abstract :
A binarization method is presented to counter the stroke connectivity problems of characters arising from mid-level-quality binary image scanning systems. In the output of a binary image scanning system, separate strokes may look connected if the point size is small and the character strokes are complex while strokes may lose connectivity if they are generated at low intensity. Also, erroneous recognition may result if a blemished document surface distorts the image. To counter these problems and to further enhance the quality of character recognition, the authors have developed an integrated binarization scheme, exploiting synergistic use of an adaptive thresholding technique and variable histogram equalization. This algorithm is composed of two components. The first removes background noise via gray level histogram equalization while the second enhances the gray level of characters over and above the surrounding background via an edge image composition technique
Keywords :
character recognition; document image processing; edge detection; adaptive thresholding technique; background noise removal; blemished document surface; character recognition; document image; edge detection; edge image composition technique; enhanced gray level; erroneous recognition; gray level histogram equalization; image distortions; improved binarization algorithm; integrated binarization scheme; mid-level-quality binary image scanning system; stroke connectivity problems; variable histogram equalization; Background noise; Character generation; Character recognition; Counting circuits; Electronics industry; Gravity; Histograms; Image edge detection; Image recognition; Industrial electronics;
Conference_Titel :
Document Analysis and Recognition, 1995., Proceedings of the Third International Conference on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-8186-7128-9
DOI :
10.1109/ICDAR.1995.601976