• DocumentCode
    3308698
  • Title

    Self-selective formation of organic masks for methane/hydrogen reactive ion etching of InP

  • Author

    Schramm, J.E. ; Yu, D.G. ; Pekarik, J.J. ; Hu, E.L. ; Merz, J.L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • fYear
    1992
  • fDate
    21-24 April 1992
  • Firstpage
    351
  • Lastpage
    353
  • Abstract
    It is demonstrated that the polymer byproduct of methane/hydrogen RIE (reactive ion etching) can be used advantageously in forming thin, yet durable etch masks. The thin masking layers are consistent with high-resolution pattern transfer, and are made possible by the etch chemistry itself. A 1000 AA mask can be used to delineate features microns deep in InP. They are particularly useful in in situ processes, such as the metal protection process, where the films are not subjected to the atmosphere until the etch is complete. Although the surface cleaning was sufficient to obtain a patterned etch, the polymer film eventually peeled. In any case, these polymer masks can easily be removed in an oxygen plasma without adversely affecting device materials or structures.<>
  • Keywords
    III-V semiconductors; indium compounds; masks; polymer films; sputter etching; 1000 AA; H/sub 2/; InP; etch masks; high-resolution pattern transfer; metal protection process; methane etching; polymer film; reactive ion etching; semiconductors; surface cleaning; Atmosphere; Chemistry; Etching; Hydrogen; Indium phosphide; Plasma applications; Plasma devices; Polymer films; Protection; Surface cleaning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1992., Fourth International Conference on
  • Conference_Location
    Newport, RI, USA
  • Print_ISBN
    0-7803-0522-1
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1992.235680
  • Filename
    235680