An integrated circuit for network analysis within 50-200 GHz

Author

Wohlgemuth, O. ; Agarwal, B. ; Pullela, R. ; Mensa, D. ; Lee, Q. ; Guthrie, J. ; Rodwell, M.J.W. ; Reuter, R. ; Braunstein, J. ; Schlechtweg, M. ; Krems, T. ; Köhler, K.

Author_Institution

Fraunhofer-Inst. for Appl. Solid State Phys., Freiburg, Germany

fYear

1998

fDate

3-4 Sep 1998

Firstpage

113

Lastpage

116

Abstract

This paper presents an integrated circuit, based on nonlinear transmission lines (NLTL), for a vector network analyzer system (VNA) within 50-200 GHz. It is the first integrated circuit containing all elements of an S-parameter test set: a multiplier to generate the RF signal, directional couplers to separate the incident and reflected waves, and a pair of high speed sampling circuits to convert the signals down to lower frequencies,

Keywords

MIMIC; S-parameters; analogue integrated circuits; directional couplers; millimetre wave measurement; network analysers; 50 to 200 GHz; S-parameter test set; directional couplers; high speed sampling circuits; mm-wave ICs; multiplier; nonlinear transmission lines; vector network analyzer system; Circuit analysis; Circuit testing; Directional couplers; Distributed parameter circuits; High speed integrated circuits; Integrated circuit testing; Radiofrequency integrated circuits; Sampling methods; Scattering parameters; Signal generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Terahertz Electronics Proceedings, 1998. THz Ninety Eight. 1998 IEEE Sixth International Conference on

Conference_Location

Leeds

Print_ISBN

0-7803-4903-2

Type

conf

DOI

10.1109/THZ.1998.731678

Filename

731678