DocumentCode
330884
Title
Complex permittivity measurements using a quasi-optical multistate reflectometer
Author
Thompson, D. ; Miles, R.E. ; Pollard, R.D.
Author_Institution
Inst. of Microwaves & Photonics, Leeds Univ., UK
fYear
1998
fDate
3-4 Sep 1998
Firstpage
163
Lastpage
165
Abstract
The complex permittivity of a well established high frequency dielectric has been measured using a quasi-optical multistate reflectometer. The permittivity is determined using two separate methods; one employing waveguide and the other a free-space measurement. The reflectometer is calibrated separately for each technique using free-space and waveguide standards. An analysis of the uncertainties involved in the measurement is given and initial results are presented
Keywords
calibration; measurement uncertainty; microwave reflectometry; permittivity measurement; submillimetre wave measurement; calibration; complex permittivity measurements; free-space measurement; free-space standards; high frequency dielectric; measurement uncertainties; quasi-optical multistate reflectometer; waveguide standards; Calibration; Circuits; Dielectric materials; Dielectric measurements; Equations; Optical materials; Optical waveguides; Permittivity measurement; Power measurement; Reflection;
fLanguage
English
Publisher
ieee
Conference_Titel
Terahertz Electronics Proceedings, 1998. THz Ninety Eight. 1998 IEEE Sixth International Conference on
Conference_Location
Leeds
Print_ISBN
0-7803-4903-2
Type
conf
DOI
10.1109/THZ.1998.731693
Filename
731693
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