DocumentCode :
3309043
Title :
The role of test protocols in testing embedded-core-based system ICs
Author :
Marinissen, Erik Jan ; Lousberg, Maurice
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
fYear :
1999
fDate :
25-28 May 1999
Firstpage :
70
Lastpage :
75
Abstract :
A core-based design style introduces new test challenges, which, if not dealt with properly, might defeat the entire purpose of using pre-designed cores. Macro Test is a liberal test approach for core-based designs, i.e., it supports all kinds of test access mechanisms to the embedded cores. The separation of tests into test protocols and test patterns plays a crucial role in Macro Test. Tasks as expansion of core-level tests to chip level, scheduling of tests, and test assembly are carried out on test protocols by software tools. This paper addresses the role of test protocols and features an example of a small scan-testable core. We argue that the fact that expansion and scheduling take place on test protocols rather than on complete tests is important to reduce the computational complexity of the associated software tools.
Keywords :
VLSI; automatic test software; design for testability; embedded systems; integrated circuit testing; protocols; software tools; Macro Test; chip level; computational complexity; core-level tests; design for testability; embedded-core-based system IC; scan-testable core; scheduling; scheduling of tests; software tools; test assembly; test protocols; Access protocols; Assembly; Circuit testing; Hardware; Integrated circuit testing; Intellectual property; Semiconductor device testing; Software testing; Software tools; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Test Workshop 1999. Proceedings
Conference_Location :
Constance, Germany
Print_ISBN :
0-7695-0390-X
Type :
conf
DOI :
10.1109/ETW.1999.804248
Filename :
804248
Link To Document :
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