DocumentCode :
3309138
Title :
Feature Based Steganalysis Using Wavelet Decomposition and Magnitude Statistics
Author :
Gireesh Kumar, T. ; Jithin, R. ; Shankar, Deepa D.
Author_Institution :
TIF AC CORE in Cyber Security, Coimbatore, India
fYear :
2010
fDate :
20-21 June 2010
Firstpage :
298
Lastpage :
300
Abstract :
Steganography is broadly used to embed information in high resolution images, since it can contain adequate information within the small portion of cover image. Steganalysis is the procedure of finding the occurrence of hidden message in an image. This paper compares the efficiency of two embedding algorithms using the image features that are consistent over a wide range of cover images, but are distributed by the presence of embedded data. Image features were extracted after wavelet decomposition of the given image. These features were then given to a SVM classifier to identify the stego content.
Keywords :
Computer security; Embedded computing; Feature extraction; Histograms; Image resolution; Statistics; Steganography; Support vector machine classification; Support vector machines; Testing; SVM; Steganalysis; Steganography; Wavelet decomposition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advances in Computer Engineering (ACE), 2010 International Conference on
Conference_Location :
Bangalore, Karnataka, India
Print_ISBN :
978-1-4244-7154-6
Type :
conf
DOI :
10.1109/ACE.2010.33
Filename :
5532820
Link To Document :
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