• DocumentCode
    3309374
  • Title

    Evaluation of fatigue strength for solder joints after thermal aging

  • Author

    Miyazaki, Takeshi ; Oomiya, Masaki ; Inoue, Hirotsugu ; Kishimoto, Kikuo ; Amagai, Masazumi

  • Author_Institution
    Dept. of Mech. & Control Eng., Tokyo Inst. of Technol., Japan
  • fYear
    2005
  • fDate
    11-14 Dec. 2005
  • Firstpage
    215
  • Lastpage
    219
  • Abstract
    Recently, preventing environmental pollutions, leadfree (Pb-free) solders are about to replace tin-lead (Sn-Pb) eutectic solders. Sn-Ag-Cu alloys are leading candidates for lead free solders. In this study, we carried out board level fatigue tests and investigated the fatigue life of several lead free solder joints. Also, the effects of pad finish metals and their thickness were investigated.
  • Keywords
    ageing; copper alloys; fatigue testing; life testing; silver alloys; solders; thermal stress cracking; tin alloys; SnAgCu; fatigue life; fatigue strength evaluation; lead free solder joints; leadfree solders; level fatigue tests; pad finish metals; thermal aging; tin-lead eutectic solders; Aging; Copper; Electronics packaging; Environmentally friendly manufacturing techniques; Fatigue; Gold; Lead; Life testing; Soldering; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Materials and Packaging, 2005. EMAP 2005. International Symposium on
  • Print_ISBN
    1-4244-0107-0
  • Type

    conf

  • DOI
    10.1109/EMAP.2005.1598264
  • Filename
    1598264