DocumentCode
3309478
Title
Measurement and identification of EMI sources using pattern recognition and coding
Author
Parrish, E.A., Jr. ; McDonald, W.E., Jr.
Author_Institution
Vanderbilt Univ., Nashville, TN, USA
fYear
1989
fDate
9-12 Apr 1989
Abstract
The authors present a methodology for measuring and identifying EMI (electromagnetic interference) sources in complex electromagnetic environments, such as exist within digital computer systems. In particular, a MAP (maximum a posteriori probability) classifier with list decoding was applied to situations involving very low signal/noise ratios, commonly found in such a problem regime. Coding was applied to the test vectors to improve performance of the system. It was shown that very low error rates are possible with very noisy signals
Keywords
computer testing; computerised instrumentation; computerised pattern recognition; digital computers; electromagnetic interference; encoding; EMI sources identification; EMI sources measurement; SNR; coding; digital computer systems; electromagnetic interference; error rates; list decoding; maximum a posteriori probability; noisy signals; pattern recognition; signal/noise ratios; test vectors; Channel capacity; Electromagnetic devices; Electromagnetic interference; Electromagnetic measurements; Error analysis; Gaussian noise; Pattern recognition; Signal to noise ratio; System testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location
Columbia, SC
Type
conf
DOI
10.1109/SECON.1989.132353
Filename
132353
Link To Document