• DocumentCode
    3309485
  • Title

    A polarimetric two-scale model for soil moisture retrieval

  • Author

    Iodice, Antonio ; Natale, Antonio ; Riccio, Daniele

  • Author_Institution
    Dipt. di Ing. Biomed., Elettron. e delle Telecomun., Univ. di Napoli Federico II, Naples, Italy
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    1265
  • Lastpage
    1268
  • Abstract
    A polarimetric two-scale surface scattering model employed to retrieve the surface parameters of bare soils from polarimetric SAR data is proposed. The scattering surface is considered as composed of slightly rough randomly tilted facets, for which the Small Perturbation Method holds. The facet random tilt causes a random variation of the local incidence angle, and a random rotation of the local incidence plane around the line of sight, which in turn causes a random rotation of the facet scattering matrix. Unlike other similar already existing approaches, our method considers both these effects. The proposed scattering model is then used to retrieve bare soil moisture and (large-scale) roughness from the co-polarized and cross-polarized ratios. The performances of the resulting retrieval algorithm is finally assessed by comparing obtained results to “in situ” measurements. To this aim, data from Little Washita campaign available in literature is employed.
  • Keywords
    geophysical techniques; radar polarimetry; soil; synthetic aperture radar; Little Washita campaign; bare soil moisture; facet scattering matrix; local incidence angle; local incidence plane; natural surface parameters; polarimetric SAR data; polarimetric two-scale surface scattering model; random rotation; random variation; rough surfaces; small perturbation method; soil moisture retrieval; Rough surfaces; Scattering; Soil measurements; Soil moisture; Surface roughness; Surface treatment; Polarimetry; Synthetic Aperture Radar (SAR); retrieval of natural surface parameters; rough surfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5650066
  • Filename
    5650066