Title :
Scanning electron microscopy with polarization analysis studies of Ni-Fe magnetic memory elements
Author :
Unguris, J. ; Scheinfein, M.R. ; Celotta, R.J. ; Pierce, D.T.
Author_Institution :
National Institute of Standards and Technology
Keywords :
Detectors; Gold; Magnetic analysis; Magnetic domains; Magnetic force microscopy; Magnetic memory; Magnetization; Polarization; Scanning electron microscopy; Spatial resolution;
Conference_Titel :
Magnetics Conference, 1989. Digests of INTERMAG '89., International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/INTMAG.1989.690361
