• DocumentCode
    330988
  • Title

    Silicon carbide power devices

  • Author

    Chante, J.P. ; Locatelli, M.L. ; Planson, D. ; Ottaviani, L. ; Morvan, E. ; Isoird, K. ; Nallet, F.

  • Author_Institution
    CNRS, Villeurbanne, France
  • Volume
    1
  • fYear
    1998
  • fDate
    6-10 Oct 1998
  • Firstpage
    125
  • Abstract
    The more and more demanding requirements of the power device users bring the silicon technology very close to its own physical limits. Silicon carbide (SiC) appears today as the only semiconductor having the capability for significantly improving the ratings of major power components (such as high voltage Schottky rectifiers), indeed for creating novel devices for new applications. The choice of SiC comes from superior physical properties, an existing substrate commercialization, and an experimental confirmation of several potentialities (at high voltage, temperature, or frequency) via demonstrative prototypes. However, such a young technology still suffers from a too poor quality of the available basic materials, and from the fabrication step immaturity, delaying the SiC power electronics emergence
  • Keywords
    power semiconductor devices; silicon compounds; wide band gap semiconductors; SiC; fabrication; high voltage Schottky rectifier; semiconductor technology; silicon carbide power device; substrate; Commercialization; Delay; Fabrication; Frequency; Prototypes; Rectifiers; Silicon carbide; Substrates; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 1998. CAS '98 Proceedings. 1998 International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-4432-4
  • Type

    conf

  • DOI
    10.1109/SMICND.1998.732305
  • Filename
    732305