Title :
A new device for smart power integrated circuits - the trench lateral DMOSFET
Author :
Zitouni, M. ; Morancho, F. ; Tranduc, H. ; Rossel, P. ; Buxo, J. ; Pages, I.
Author_Institution :
CNRS, Toulouse, France
Abstract :
In this paper, a new concept of lateral DMOSFET for medium voltage (<100 Volts) Smart Power Integrated Circuits is proposed. This structure called LUDMOSFET features a reduced specific on-resistance and enhanced breakdown voltage. For example, for a breakdown voltage of 50 V, the specific on-resistance is 1.2 mΩ.cm2 in the conventional LDMOSFET, 0.8 mΩ.cm2 in the LUDMOS without polysilicon (i.e. 30 percent reduction) and 0.6 mΩ.cm2 in the LUDMOS with polysilicon (i.e. 50 percent reduction)
Keywords :
power MOSFET; power integrated circuits; semiconductor device breakdown; 50 V; LUDMOSFET; Si; breakdown voltage; polysilicon; smart power integrated circuit; specific on-resistance; trench lateral DMOSFET; Bipolar transistors; Breakdown voltage; Doping; Electric breakdown; Electric resistance; Electrodes; Immune system; MOSFETs; Medium voltage; Power integrated circuits;
Conference_Titel :
Semiconductor Conference, 1998. CAS '98 Proceedings. 1998 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-4432-4
DOI :
10.1109/SMICND.1998.732307