Title :
Hc measurement of microscopic regions on thin film magnetic discs using longitudinal Kerr effect
Author :
Abe, K. ; Fujimaki, S. ; Furusawa, K. ; Kataoka, H. ; Takagaki, T.
Author_Institution :
Hitachi Ltd.
Keywords :
Kerr effect; Laser beams; Magnetic field measurement; Magnetic films; Magnetic force microscopy; Magnetooptic effects; Production engineering; Sputtering; Surface emitting lasers; System testing;
Conference_Titel :
Magnetics Conference, 1989. Digests of INTERMAG '89., International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/INTMAG.1989.690363