DocumentCode
331020
Title
Test system for studies about devices´ behaviour at low temperature
Author
Iliescu, Mariana ; Culcer, M. ; Curuia, M. ; Cristescu, Ioana
Author_Institution
Inst. of Cryogenics & Isotope Separations, Romania
Volume
1
fYear
1998
fDate
6-10 Oct 1998
Firstpage
271
Abstract
The paper presents a test system based on a cryostat and a gas thermometer used for studies about materials and devices behavior at low temperature. The system´s functioning principle is described, including the gas thermometer´s equation and its correcting terms and also the calculus method for setting-up the device-holder´s isotherms. Finally, a discussion on the system´s performances and the characteristics of some devices (a PRT and a FET) at low temperatures are given
Keywords
cryostats; low-temperature techniques; semiconductor device testing; thermometers; FET; PRT; calculus method; cryostat; gas thermometer; holder isotherm; low temperature test system; semiconductor device; Cryogenics; DH-HEMTs; Equations; Heat pumps; Heat transfer; Materials testing; Resistance heating; System testing; Temperature control; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 1998. CAS '98 Proceedings. 1998 International
Conference_Location
Sinaia
Print_ISBN
0-7803-4432-4
Type
conf
DOI
10.1109/SMICND.1998.732371
Filename
732371
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