Title :
Test system for studies about devices´ behaviour at low temperature
Author :
Iliescu, Mariana ; Culcer, M. ; Curuia, M. ; Cristescu, Ioana
Author_Institution :
Inst. of Cryogenics & Isotope Separations, Romania
Abstract :
The paper presents a test system based on a cryostat and a gas thermometer used for studies about materials and devices behavior at low temperature. The system´s functioning principle is described, including the gas thermometer´s equation and its correcting terms and also the calculus method for setting-up the device-holder´s isotherms. Finally, a discussion on the system´s performances and the characteristics of some devices (a PRT and a FET) at low temperatures are given
Keywords :
cryostats; low-temperature techniques; semiconductor device testing; thermometers; FET; PRT; calculus method; cryostat; gas thermometer; holder isotherm; low temperature test system; semiconductor device; Cryogenics; DH-HEMTs; Equations; Heat pumps; Heat transfer; Materials testing; Resistance heating; System testing; Temperature control; Temperature distribution;
Conference_Titel :
Semiconductor Conference, 1998. CAS '98 Proceedings. 1998 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-4432-4
DOI :
10.1109/SMICND.1998.732371
