Title :
A novel CMOS imager with 2-dimensional binarization and edge detection for highly integrated imaging systems
Author :
Hsiao, Pei-Yung ; Lee, Chia-Hao ; Tsai, Chia-Chun
Author_Institution :
Dept. of Electron. Eng., Chang Gung Univ.
Abstract :
The proposed CMOS imager successfully embeds an advanced local threshold algorithm to simultaneously achieve the 2-dimensional operations of binarization and edge detection. Both functions provide a lot of widely spread applications for real-time imaging systems. A 64 times 64 pixel array imager is implemented in the TSMC 0.35 mum 2P4M technology. Each pixel has the size of 10 mum times 10 mum with a fill factor of 36.1%. The test chip occupies 1.80 mm times 1.63 mm and consumes 15 mW from a 3.3 V power supply
Keywords :
CMOS image sensors; edge detection; 0.35 mum; 15 mW; 2-dimensional binarization; 3.3 V; CMOS imager; advanced local threshold algorithm; edge detection; highly integrated imaging systems; real-time imaging systems; Biomedical imaging; CMOS technology; Costs; Image edge detection; Pixel; Power supplies; Real time systems; Tellurium; Testing; Vehicles;
Conference_Titel :
Consumer Electronics, 2006. ICCE '06. 2006 Digest of Technical Papers. International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-9459-3
DOI :
10.1109/ICCE.2006.1598315
