Title :
Near Field Microscopy for Nanostructure Quality Characterization in Millimeter Wave Range
Author :
Derkach, V.N. ; Tarapov, S.I. ; Nedukh, S.V. ; Anbinderis, T. ; Laurinavicius, A.
Author_Institution :
Usikov Inst. of Radiophys. & Electron., NAS of Ukraine, Kharkov
Abstract :
Millimetre waves near-field microscopy are described. Examples of radio images (amplitude and phase pictures) optically opaque subjects with use of methods of near-field microscopy and also results of investigations of spatial inhomogeneity of properties in multilayered thin-film nanostructures with effect of giant magnetic impedance are resulted in the field of frequencies 35-80GammaGammamu.
Keywords :
millimetre wave spectra; multilayers; nanostructured materials; giant magnetic impedance; millimetre waves near-field microscopy; multilayered thin-film nanostructures; optically opaque subjects; Circuit testing; Electronic equipment testing; Frequency; Integrated circuit testing; Microscopy; Microwave devices; Microwave theory and techniques; Millimeter wave measurements; Millimeter wave technology; Periodic structures;
Conference_Titel :
Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves and Workshop on Terahertz Technologies, 2007. MSMW '07. The Sixth International Kharkov Symposium on
Conference_Location :
Kharkov
Print_ISBN :
1-4244-1237-4
DOI :
10.1109/MSMW.2007.4294829
