DocumentCode :
3310969
Title :
The Procedure of Half-Wave Number Measurement at Resonant Frequencies
Author :
Chukhov, V.V.
Author_Institution :
Zhytomyr State Technol. Univ., Zhytomyr
Volume :
2
fYear :
2007
fDate :
25-30 June 2007
Firstpage :
836
Lastpage :
838
Abstract :
Waveguides methods of dielectric permeability measurement are widely used for their simplicity. Typical measurement cell in these methods is waveguide segment with flat dielectric layer (specimen). If dielectric without loss, VSWR (voltage standing wave ratio) frequency response for this cell has periodic, low damping character. Frequencies of VSWR minimum are resonant frequencies and frequencies of VSWR maximum are antiresonant frequencies. It gives possibility to produce method of dielectric permeability measurement, which uses means resonant or antiresonant frequencies only.
Keywords :
dielectric losses; dielectric measurement; dielectric thin films; dielectric waveguides; frequency response; permeability; dielectric permeability measurement; flat dielectric layer; frequency response; half-wave number measurement; resonant frequency; voltage standing wave ratio; waveguide methods; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency measurement; Frequency response; Length measurement; Permeability measurement; Resonance; Resonant frequency; Waveguide components;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves and Workshop on Terahertz Technologies, 2007. MSMW '07. The Sixth International Kharkov Symposium on
Conference_Location :
Kharkov
Print_ISBN :
1-4244-1237-4
Type :
conf
DOI :
10.1109/MSMW.2007.4294831
Filename :
4294831
Link To Document :
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