Title :
A Nomogram Technique for Microwave Permittivity Determination Using an Open-Ended Coaxial Probe
Author :
Ivanov, V.K. ; Silin, O.O. ; Stadn, O.M.
Author_Institution :
Inst. for Radiophys. & Electron., Kharkov
Abstract :
A nomogram approach is proposed for the determination of the complex permittivity of thin dielectric layers using an open-ended coaxial probe. Nomograms generated for more narrow range of permittivity and having sufficiently dense grid allow direct determination of dielectric constant.
Keywords :
dielectric thin films; nomograms; permittivity; permittivity measurement; complex permittivity; dielectric constant; microwave permittivity; nomogram technique; open-ended coaxial probe; thin dielectric layers; Admittance; Apertures; Biological materials; Biological system modeling; Coaxial components; Frequency; Microwave theory and techniques; Millimeter wave radar; Permittivity measurement; Probes;
Conference_Titel :
Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves and Workshop on Terahertz Technologies, 2007. MSMW '07. The Sixth International Kharkov Symposium on
Conference_Location :
Kharkov
Print_ISBN :
1-4244-1237-4
DOI :
10.1109/MSMW.2007.4294857
