DocumentCode :
3311764
Title :
Seeing behind the scene: analysis of photometric properties of occluding edges by the reversed projection blurring model
Author :
Asada, Naoki ; Fujiwara, Hisanaga ; Matsuyama, Takashi
Author_Institution :
Dept. of Inf. Technol., Okayama Univ., Japan
fYear :
1995
fDate :
20-23 Jun 1995
Firstpage :
150
Lastpage :
155
Abstract :
This paper analyzes photometric properties of occluding edges and proves that (1) we can observe surface edges on the farther object located close to the occluding edge even if they are occluded by the nearer object, (2) the image of an occluding edge coincides with that of a surface edge on the nearer object if the brightness of the farther object is uniform around the occluding edge. First, we propose a blurring model named the reversed projection blurring model to analyze photometric properties of blurring phenomena of an occluding edge. Using this model, the theoretical proof of the two properties mentioned above is given. Finally, experimental results in real world environments demonstrate the validity of our blurring model as well as the observability of the photometric properties of occluding edges
Keywords :
computer vision; optical transfer function; blurring model; brightness; observability; occluding edge; occluding edges; photometric properties; real world environments; reversed projection blurring model; surface edge; surface edges; Brightness; Cameras; Focusing; Geometrical optics; Image analysis; Information technology; Layout; Lenses; Photometry; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision, 1995. Proceedings., Fifth International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-7042-8
Type :
conf
DOI :
10.1109/ICCV.1995.466793
Filename :
466793
Link To Document :
بازگشت