Title :
Recognition of impurity in ampoules based on wavelet packet decomposition energy distribution and SVM
Author :
Jiedi, Sun ; Jiangtao, Wen
Author_Institution :
Dept. of Inf. Sci. & Eng., Yanshan Univ., Qinhuangdao, China
Abstract :
It presents a feature extraction and recognition method in this paper based on wavelet packet decomposition energy and support vector machine to solve the problem of recognizing the visible impurity in ampoules. The ampoules pictures are taken by the automatic ampoule inspection machine. The zone containing impurity is segmented and called ROI (region of interesting) using the sequence difference and the key point detection. The conventional image processing method can´t meet the requirements of fast processing in the industrial field. It proposes a method based on the information entropy of ROI to extract the useful information and generate a one-dimensional signal. The signal is decomposed by wavelet packet, and then the principal feature vectors are extracted using PCA from the wavelet packet energy components. As the input vectors of support vector machine, the impurity features can be classified rapidly by SMO (sequential minimal optimization). The different types of kernel functions and the corresponding parameters are selected for training and testing in the experiments. The results show that the time-consuming of SVM (support vector machine) is decreased by 60% and the identification accuracy is improved by 35%, compared with the BP network.
Keywords :
backpropagation; entropy; feature extraction; image segmentation; image sequences; information retrieval; object detection; object recognition; support vector machines; wavelet transforms; BP network; automatic ampoule inspection machine; feature extraction; impurity recognition; information entropy; information extraction; key point detection; region of interesting; sequence difference; sequential minimal optimization; support vector machine; wavelet packet decomposition energy distribution; Data mining; Feature extraction; Image processing; Image segmentation; Impurities; Information entropy; Inspection; Support vector machine classification; Support vector machines; Wavelet packets; impurity type recognition; information entropy; principal component analysis; support vector machine; wavelet packet decomposition energy distribution;
Conference_Titel :
Computer Science and Information Technology, 2009. ICCSIT 2009. 2nd IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4519-6
Electronic_ISBN :
978-1-4244-4520-2
DOI :
10.1109/ICCSIT.2009.5234594