DocumentCode :
3312593
Title :
Modeling of shielded, suspended and inverted, microstrip lines
Author :
Musa, Sarhan M. ; Sadiku, Matthew N O
Author_Institution :
Prairie View A&M Univ., Prairie View
fYear :
2008
fDate :
3-6 April 2008
Firstpage :
309
Lastpage :
313
Abstract :
Electromagnetic simulation and modeling of suspended-substrate microstrip lines have an important role in designing microwave and millimeter- wave integrated circuits. Suspended- substrate microstrip lines are sometimes manufactured and placed in a shield to reduce performance degradation from external influences. In this paper, we will illustrate modeling of shielded, suspended-substrate, microstrip lines using the finite element method(FEM). We specifically determine the capacitance per unit length, inductance per unit length, and characteristic impedance of shielded, suspended, microstrip lines. We compared our results with those obtained by other methods and found them to be in agreement. We extended the modeling by designing our own model of shielded, inverted, microstrip lines and compared it with shielded, suspended, microstrip lines. We found them to be very close.
Keywords :
electromagnetic shielding; finite element analysis; microstrip lines; FEM; electromagnetic simulation; finite element method; microwave integrated circuit; millimeter-wave integrated circuit; suspended-substrate microstrip line modeling; Circuit simulation; Degradation; Electromagnetic modeling; Electromagnetic scattering; Electromagnetic shielding; Finite element methods; Integrated circuit modeling; Manufacturing; Microstrip; Microwave integrated circuits; Finite element method; capacitance per unit length; characteristic impedance; inductance per unit length; inverted microstrip line; suspended microstrip line;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Southeastcon, 2008. IEEE
Conference_Location :
Huntsville, AL
Print_ISBN :
978-1-4244-1883-1
Electronic_ISBN :
978-1-4244-1884-8
Type :
conf
DOI :
10.1109/SECON.2008.4494310
Filename :
4494310
Link To Document :
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