DocumentCode
3312770
Title
An adaptive filtering approach to dynamics effect compensation in nanoscale broadband viscoelasticity measurements of soft materials
Author
Xie, Ping ; Xu, Zhonghua ; Zou, Qingze ; Xu, Hongbing
Author_Institution
Sch. of Electr. Eng., Yanshan Univ., Qinhuangdao, China
fYear
2009
fDate
15-18 Dec. 2009
Firstpage
8284
Lastpage
8289
Abstract
In this article, an adaptive filtering approach to compensate for instrument dynamics effect on nanoscale broadband material viscoelasticity measurements is proposed. Although a large frequency range of measurement (i.e., broadband) is desirable in mechanical property characterization of materials, the measurement frequency range is, in general, limited by the dynamics of the measurement instrument. Such a limit arises because the instrument dynamics can be convoluted with the mechanical response of the material in the measured data, particularly when the excitation force profile consists of multiple frequencies and becomes fast. The contribution of this article is the use of adaptive filtering approach to eliminate the instrument dynamics effect in nanoscale broadband viscoelasticity measurement using atomic force microscope (AFM). The proposed approach is illustrated by implementing it to compensate for the dynamic effects in the broadband viscoelasticity measurement of a polydimethylsiloxane (PDMS) sample using AFM.
Keywords
adaptive filters; atomic force microscopy; force control; instrumentation; laboratory techniques; nanotechnology; viscoelasticity; adaptive filtering approach; atomic force microscope; excitation force profile; instrument dynamics; mechanical property characterization; nanoscale broadband viscoelasticity measurements; polydimethylsiloxane sample; soft material measurement; Adaptive filters; Atomic force microscopy; Atomic measurements; Elasticity; Force measurement; Frequency measurement; Instruments; Mechanical variables measurement; Nanostructured materials; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
Conference_Location
Shanghai
ISSN
0191-2216
Print_ISBN
978-1-4244-3871-6
Electronic_ISBN
0191-2216
Type
conf
DOI
10.1109/CDC.2009.5400599
Filename
5400599
Link To Document