Title :
Blocking parameterizations for improving the computational tractability of affine disturbance feedback MPC problems
Author :
Oldewurtel, Frauke ; Gondhalekar, Ravi ; Jones, Colin N. ; Morari, Manfred
Author_Institution :
Dept. of Electr. Eng., ETH Zurich, Zurich, Switzerland
Abstract :
Many model predictive control (MPC) schemes suffer from high computational complexity. Especially robust MPC schemes, which explicitly account for the effects of disturbances, can result in computationally intractable problems. So-called move-blocking is an effective method of reducing the computational complexity of MPC problems. Unfortunately move-blocking precludes the use of terminal constraints as a means of enforcing strong feasibility of MPC problems. Thus move-blocking MPC has traditionally been employed without rigorous guarantees of constraint satisfaction. A method for enforcing strong feasibility of nominal move-blocking MPC problems was recently developed. The contribution of this paper is to generalize this method and employ it for the purpose of enforcing strong feasibility of move-blocking affine disturbance feedback robust MPC problems. Furthermore the effectiveness of different disturbance-feedback blocking strategies is investigated by means of a numerical example.
Keywords :
computational complexity; discrete time systems; dynamic programming; feedback; linear systems; predictive control; robust control; affine disturbance feedback; computational complexity; computational tractability; constraint satisfaction; disturbance-feedback blocking strategies; model predictive control; move-blocking procedure; robust MPC schemes; Computational complexity; Dynamic programming; Open loop systems; Optimal control; Predictive control; Predictive models; Robust control; Robustness; Stability; State feedback; Affine disturbance feedback; Controlled invariant feasibility; Model predictive control; Robust control;
Conference_Titel :
Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3871-6
Electronic_ISBN :
0191-2216
DOI :
10.1109/CDC.2009.5400609