• DocumentCode
    3312956
  • Title

    Reliability-Aware Instruction Set Customization for ASIPs with Hardened Logic

  • Author

    Bordoloi, Unmesh D. ; Tanasa, Bogdan ; Tahoori, Mehdi B. ; Eles, Petru ; Peng, Zebo ; Shazli, Syed Z. ; Chakraborty, Samarjit

  • Author_Institution
    Linkopings Univ., Linkoping, Sweden
  • fYear
    2012
  • fDate
    19-22 Aug. 2012
  • Firstpage
    164
  • Lastpage
    173
  • Abstract
    Application-specific instruction-set processors (ASIPs) allow the designer to extend the instruction set of the base processor with selected custom instructions to tailor-fit the application. In this paper, with the help of a motivational example, we first demonstrate that different custom instructions are vulnerable to faults with varying probabilities. This shows that by ignoring the vulnerability to faults, traditional methods of instruction set customization can provide no guarantees on the reliability of the system. Apart from such inherent disparity in error vulnerability across custom instructions, each custom instruction can have multiple implementation choices corresponding to varying hardened levels. Hardening reduces the vulnerability to errors but this comes at the overhead of area costs and reduced performance gain. In this paper, we propose a framework to select custom instructions and their respective hardening levels such that reliability is optimized while the performance gain is satisfied and area costs are met as well. Our framework is based on a novel analytical method to compute the overall system reliability based on the probability of failure of individual instructions. Wide range of experiments that were conducted illustrate how our tool navigates the design space to reveal interesting tradeoffs.
  • Keywords
    instruction sets; integrated circuit reliability; microprocessor chips; ASIP; analytical method; application-specific instruction-set processors; custom instructions; error vulnerability; hardened logic; instruction set customization; reliability-aware instruction set customization; system reliability; Circuit faults; Hardware; Optimization; Performance gain; Program processors; Reliability; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Embedded and Real-Time Computing Systems and Applications (RTCSA), 2012 IEEE 18th International Conference on
  • Conference_Location
    Seoul
  • ISSN
    1533-2306
  • Print_ISBN
    978-1-4673-3017-6
  • Electronic_ISBN
    1533-2306
  • Type

    conf

  • DOI
    10.1109/RTCSA.2012.28
  • Filename
    6300148