DocumentCode :
3313183
Title :
Roundoff error-free tests in algorithm-based fault tolerant matrix operations on 2-D processor arrays
Author :
Wei, Dah-Yea D. ; Kim, Jung H. ; Rao, T.R.N.
Author_Institution :
Center for Adv. Comput. Studies, Southwestern Louisiana Univ., Lafayette, LA, USA
fYear :
1994
fDate :
17-19 Oct 1994
Firstpage :
74
Lastpage :
82
Abstract :
Assaad and Dutt [1992] proposed the hybrid checksum test method for the floating-point matrix-matrix multiplication in ABFT environment, by which the error coverage can be greatly increased. However, the threshold test in their approach is still necessary in the floating-point addition part of the matrix multiplication, and the number of error detections decreases with the increase in the dynamic range of data. Here, instead of using the threshold floating-point checksum test, we present an effective method, called the concurrent floating-point checksum (CFPC) test. The proposed CFPC test provides complete error detection/correction capabilities in floating-point additions with less time latency and hardware overhead regardless of the dynamic range of input data
Keywords :
fault tolerant computing; 2D processor arrays; algorithm-based fault tolerant matrix operations; concurrent floating-point checksum test; dynamic range; error correction; error detection; floating-point additions; hardware overhead; roundoff error-free tests; time latency; Computer errors; Delay; Dynamic range; Error correction; Fault detection; Fault tolerance; Hardware; Information science; Performance evaluation; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1994. Proceedings., The IEEE International Workshop on
Conference_Location :
Montreal, Que.
ISSN :
1550-5774
Print_ISBN :
0-8186-6307-3
Type :
conf
DOI :
10.1109/DFTVS.1994.630016
Filename :
630016
Link To Document :
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