DocumentCode
3313299
Title
Using the BS register for capturing and storing n-bit sequences in real-time
Author
Alves, Gustavo Ribeiro ; Ferreira, José M Martins
Author_Institution
ISEP/DEE, Porto, Portugal
fYear
1999
fDate
25-28 May 1999
Firstpage
130
Lastpage
135
Abstract
Boundary Scan test is now widely accepted and used for the structural test of Printed Circuit Boards. However, the more demanding requirements of prototype debug and validation are not sufficiently covered by the mandatory and optional operating modes described in the IEEE 1149.1 Standard. Previous work has focused on this problem, having resulted in a new set of user-defined optional instructions addressing the use of the BS register to store in real-time; a sequence of continuous vectors, captured at its parallel inputs without/until/after a certain condition is found. In this paper we describe the trade-off between input channels and storage capacity, by proposing a new operating mode where the BS register is used to capture/store an n-bit sequence captured at one single functional pin. We also describe how this operating mode can be further extended into the P1149.4 domain, for capturing/storing the n-bit data stream generated by a /spl Sigma//spl Delta/ converter placed in the TBIC.
Keywords
IEEE standards; automatic testing; boundary scan testing; design for testability; printed circuit testing; real-time systems; 1149.4 domain; BS register; IEEE 1149.1 Standard; PC testing; PCB testing; Printed Circuit Boards; TBIC; bit data stream; input channels; n-bit sequence; operating mode; prototype debug; real-time; storage capacity; structural test; validation; Binary search trees; Circuit testing; Debugging; Identity-based encryption; Indium phosphide; Printed circuits; Prototypes; System testing; Tellurium; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
European Test Workshop 1999. Proceedings
Conference_Location
Constance, Germany
Print_ISBN
0-7695-0390-X
Type
conf
DOI
10.1109/ETW.1999.804501
Filename
804501
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