• DocumentCode
    3313299
  • Title

    Using the BS register for capturing and storing n-bit sequences in real-time

  • Author

    Alves, Gustavo Ribeiro ; Ferreira, José M Martins

  • Author_Institution
    ISEP/DEE, Porto, Portugal
  • fYear
    1999
  • fDate
    25-28 May 1999
  • Firstpage
    130
  • Lastpage
    135
  • Abstract
    Boundary Scan test is now widely accepted and used for the structural test of Printed Circuit Boards. However, the more demanding requirements of prototype debug and validation are not sufficiently covered by the mandatory and optional operating modes described in the IEEE 1149.1 Standard. Previous work has focused on this problem, having resulted in a new set of user-defined optional instructions addressing the use of the BS register to store in real-time; a sequence of continuous vectors, captured at its parallel inputs without/until/after a certain condition is found. In this paper we describe the trade-off between input channels and storage capacity, by proposing a new operating mode where the BS register is used to capture/store an n-bit sequence captured at one single functional pin. We also describe how this operating mode can be further extended into the P1149.4 domain, for capturing/storing the n-bit data stream generated by a /spl Sigma//spl Delta/ converter placed in the TBIC.
  • Keywords
    IEEE standards; automatic testing; boundary scan testing; design for testability; printed circuit testing; real-time systems; 1149.4 domain; BS register; IEEE 1149.1 Standard; PC testing; PCB testing; Printed Circuit Boards; TBIC; bit data stream; input channels; n-bit sequence; operating mode; prototype debug; real-time; storage capacity; structural test; validation; Binary search trees; Circuit testing; Debugging; Identity-based encryption; Indium phosphide; Printed circuits; Prototypes; System testing; Tellurium; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Test Workshop 1999. Proceedings
  • Conference_Location
    Constance, Germany
  • Print_ISBN
    0-7695-0390-X
  • Type

    conf

  • DOI
    10.1109/ETW.1999.804501
  • Filename
    804501