DocumentCode
3313335
Title
On fractal yield models: a statistical paradox
Author
Stapper, C.H. ; Rideout, A.J.
Author_Institution
Jericho, VT, USA
fYear
1994
fDate
17-19 Oct 1994
Firstpage
83
Lastpage
87
Abstract
Although the fractal yield model is very successful in VLSI applications, it also exposes a mathematical inconsistency. Expressing the average number of faults in each sub array, the average number of faults in the complete array, according to this approach, is not statistically correct. This, therefore, is a fractal paradox
Keywords
Fault tolerance; Fractals; Frequency; Length measurement; Particle measurements; Probability distribution; Semiconductor device measurement; Shape measurement; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1994. Proceedings., The IEEE International Workshop on
Conference_Location
Montreal, Que.
ISSN
1550-5774
Print_ISBN
0-8186-6307-3
Type
conf
DOI
10.1109/DFTVS.1994.630017
Filename
630017
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