Intrinsic phase noise properties and frequency stability of millimetre-wave module at 90 GHz

Author

Bara-Maillet, Romain ; Parker, S.R. ; Le Floch, J.-M. ; Tobar, M.E.

Author_Institution

Sch. of Phys. (M013), Univ. of Western Australia, Crawley, WA, Australia

Volume

49

Issue

14

fYear

2013

fDate

July 4 2013

Firstpage

886

Lastpage

887

Abstract

A report is presented on the residual intrinsic phase noise properties of a millimetre-wave module used to generate W-band signals from an X-band analogue signal generator. The 90 GHz outputs of two nominally identical millimetre-wave modules are heterodyned to measure their instantaneous frequency fluctuations and hence infer the close-to-carrier phase noise. The fractional frequency stability at 1 s integration time is 2 × 10^-14, which corresponds to a total single-sideband phase noise of -50 dBc/Hz at 1 Hz Fourier frequency offset from the carrier and a residual single-sideband phase noise of -52 dBc/Hz at 1 Hz offset.

Keywords

circuit noise; frequency measurement; frequency stability; millimetre wave circuits; millimetre wave generation; modules; noise generators; phase noise; Fourier frequency offset; W-band signal generation; X-band analogue signal generator; carrier single-sideband phase noise; close-to-carrier phase noise; fractional frequency stability; frequency 90 GHz; instantaneous frequency fluctuation measurement; millimetre wave module; residual intrinsic phase noise property; residual single-sideband phase noise; time 1 s;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el.2013.1469

Filename

6557256