Title :
Design of low noise Amplifier using 90nm gate underlap SOI MOSFET for millimeter wave applications
Author :
Singh, Indra Vijay ; Alam, M.S. ; Armstrong, G.A.
Author_Institution :
Dept. of Electron. Eng., A.M.U., Aligarh, India
Abstract :
This paper presents the significance of optimization of gate-source/drain extension region engineering (also known as under lap design) in 90nm Silicon-on-Insulator (SOI) MOSFET to improve the performance of a low noise Amplifier (LNA) for millimeter wave (mm-w) applications. A small signal model of underlap SOI MOSFET (with an optimized value of spacer- to- straggle ratio (s/σ) = 3.2 and doping gradient d 5nm/decade) has been developed and implemented in circuit simulator. Based on new Figure - of- Merit (FoM) involving voltage gain AV, unity gain frequency fT, forward gain S21, noise figure NF and dc power consumption PDC, the paper describes the significance of nano-scale SOI underlap design as compared to conventional (non underlap) design. The LNA designed using underlap exhibits nearly 10 dB gain, 4.1 dB NF and 13 mW power consumption in the frequency range from 15-20 GHz, which is suitable for M-Sequence ultra wideband Radar used in automotive vehicle.
Keywords :
MOSFET circuits; integrated circuit design; integrated circuit modelling; low noise amplifiers; millimetre wave amplifiers; silicon-on-insulator; M-sequence ultra wideband radar; SOI MOSFET; Si; automotive vehicle; circuit simulator; dc power consumption; doping gradient; figure-of-merit; forward gain; frequency 15 GHz to 20 GHz; gain 10 dB; gate-source/drain extension region engineering; low noise amplifier; millimeter wave applications; nano-scale SOI underlap design; noise figure; noise figure 4.1 dB; power 13 mW; silicon-on-insulator MOSFET; size 90 nm; small signal model; spacer- to-straggle ratio; under lap design; unity gain frequency; voltage gain; Gain; Low-noise amplifiers;
Conference_Titel :
Multimedia, Signal Processing and Communication Technologies (IMPACT), 2011 International Conference on
Conference_Location :
Aligarh
Print_ISBN :
978-1-4577-1105-3
DOI :
10.1109/MSPCT.2011.6150501