DocumentCode
3313802
Title
Some results on improving the code length of SbEC-DED codes
Author
Xiao, Sihai ; Shi, Xiaofa ; Feng, G.L. ; Rao, T.R.N.
Author_Institution
Center for Adv. Comput. Studies, Southwestern Louisiana Univ., Lafayette, LA, USA
fYear
1994
fDate
17-19 Oct 1994
Firstpage
151
Lastpage
158
Abstract
The single b-bit byte error correcting and double bit error detecting (SbEC-DED) codes have important applications in computer high-speed memories. In 1992, a class of practical SbEC-DED codes was given by Fujiwara and Hamada. Their constructions are based on the existence of cosets of a subfield of GF(2b) where the codes are defined. The code length is determined by the number of the cosets and the size of the cosets. Clearly, there is a major drawback in their constructions, that is, the constructions will fail if b is a prime since there exists no nontrivial subfield. To overcome this weakness, we present a more general construction method using subsets of GF(2b ) instead of the cosets of a subfield of GF(2b). By doing this, the codes obtained by Fujiwara and Hamada are special cases of our constructions and, for some b, the sets used in our construction are bigger than the cosets they used and hence a larger code length can be obtained
Keywords
error correction codes; GF(2b) subsets; SbEC-DED codes; code length; computer high-speed memories; single b-bit byte error correcting and double bit error detecting codes; Application software; Computer applications; Computer errors; Conferences; Error correction codes; Fault tolerant systems; Random access memory; Read-write memory; Semiconductor memory; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1994. Proceedings., The IEEE International Workshop on
Conference_Location
Montreal, Que.
ISSN
1550-5774
Print_ISBN
0-8186-6307-3
Type
conf
DOI
10.1109/DFTVS.1994.630025
Filename
630025
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