DocumentCode :
3314094
Title :
Multi up-gradation software reliability model
Author :
Kapur, P.K. ; Tandon, Abhishek ; Kaur, Gurjeet
Author_Institution :
Dept. of Operational Res., Univ. of Delhi, Delhi, India
fYear :
2010
fDate :
14-16 Dec. 2010
Firstpage :
468
Lastpage :
474
Abstract :
In software industry, up gradations are made in the software at a very brisk speed. The life of software is very short in the environment of perfect competition market therefore they have to come up with successive up gradations to survive. Features added to the software at frequent time intervals lead to complexity in the software system and add to the number of faults in the software. The developer of the software can lose on market share if it neglects the up gradation in the software but on the other hand a software company can lose its name and goodwill in the market if the functionalities added to the software leads to an increase in the number of faults of the software. To capture the effect of faults generated in the software due to add-ons at various point in time we develop a multi up gradation, multi release software reliability model. This model uniquely identifies the faults left in the software when it is in operational phase during the testing of the new code i.e, developed while adding new features to the existing software. The model developed is validated on real data sets with software which has been released in the market with new features four times.
Keywords :
configuration management; program testing; software fault tolerance; software maintenance; software metrics; code testing; fault identification; multirelease software reliability model; multiupgradation software reliability model; perfect competition market; software add-ons; software complexity; software fault; software features; software functionality; software industry; software life; software system; NHPP; Software reliability; multi up gradation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability, Safety and Hazard (ICRESH), 2010 2nd International Conference on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4244-8344-0
Type :
conf
DOI :
10.1109/ICRESH.2010.5779595
Filename :
5779595
Link To Document :
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