• DocumentCode
    3314304
  • Title

    Software reliability estimation through black box and white box testing at prototype level

  • Author

    Mohan, K. Krishna ; Verma, A.K. ; Srividya, A.

  • Author_Institution
    Reliability Eng., Indian Inst. of Technol. Bombay, Mumbai, India
  • fYear
    2010
  • fDate
    14-16 Dec. 2010
  • Firstpage
    517
  • Lastpage
    522
  • Abstract
    Software reliability refers to the probability of failure-free operation of a system. It is related to many aspects of software, including the testing process. Directly estimating software reliability by quantifying its related factors can be difficult. Testing is an effective sampling method to measure software reliability. Guided by the operational profile, software testing (usually black-box testing) can be used to obtain failure data, and an estimation model can be further used to analyze the data to estimate the present reliability and predict future reliability. White box testing is based on inter-component interactions which deal with probabilistic software behavior. It uses an internal perspective of the system to design test cases based on internal structure at requirements and design phases. This paper has been applied for evolution of effective reliability quantification analysis at prototype level of a financial application case study with both failure data test data of software Development Life cycle (SDLC) phases captured from defect consolidation table in the form orthogonal defect classification as well functional requirements at requirement and design phases captured through software architectural modeling paradigms.
  • Keywords
    formal specification; program testing; software architecture; software reliability; black box testing; failure-free system operation; financial application; form orthogonal defect classification; functional requirements; probabilistic software behavior; reliability quantification analysis; software architectural modeling; software development life cycle; software reliability estimation; software testing; white box testing; Parallel processing; Software; Software reliability; Testing; Black-Box; Petri nets; Reliability estimation; Software architecture; White-Box; orthogonal defect classification (ODC);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability, Safety and Hazard (ICRESH), 2010 2nd International Conference on
  • Conference_Location
    Mumbai
  • Print_ISBN
    978-1-4244-8344-0
  • Type

    conf

  • DOI
    10.1109/ICRESH.2010.5779604
  • Filename
    5779604