Title :
An Experimental Analysis of SEU Sensitiveness on System Knowledge-based Hardening Techniques
Author :
Ruano, O. ; Reyes, P. ; Maestro, J.A. ; Sterpone, L. ; Reviriego, P.
Author_Institution :
Univ. Antonio de Nebrija Madrid, Madrid
Abstract :
Logic soft errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft errors are traditionally referred as single event effects. In this paper, system knowledge-based hardening techniques using recursive structures for the implementation of moving average filters that provide protection against single event upsets are evaluated through two fault injection systems based on simulation and emulation respectively. Fault injection campaigns show that system knowledge-based redundancy techniques can achieve the same level of dependability as standard redundancy techniques, such as triple modular redundancy, while having optimal cost.
Keywords :
fault simulation; radiation hardening (electronics); SEU sensitiveness; fault injection system; logic soft errors; moving average filter; recursive structure; single event upsets; system knowledge-based hardening; Aerospace electronics; Circuit faults; Discrete event simulation; Emulation; Filters; Logic circuits; Protection; Radiation hardening; Redundancy; Single event upset;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and Systems, 2007. DDECS '07. IEEE
Conference_Location :
Krakow
Print_ISBN :
1-4244-1162-9
Electronic_ISBN :
1-4244-1162-9
DOI :
10.1109/DDECS.2007.4295294