Title :
Piezoresistive effects in thick film resistors for strain sensing applications
Author :
Kerns, D.V., Jr. ; Kang, W.P. ; Ali-Ali, A.R.
Author_Institution :
Dept. of Electr. Eng., Vanderbilt Univ., Nashville, TN, USA
Abstract :
Experimental investigations of piezoresistive effects in thick-film resistors were performed by measuring longitudinal and transverse gauge factors as a function of applied strain on two different substrates´ thickness. The relative change in resistance of the thick-film resistors studied was linear, symmetric, reproducible, and free of measurable hysteresis for strain between 0 and ±1000 microstrain. A gauge factor of approximately twice that previously reported was obtained. The suitability of this technology for strain-sensing applications is discussed
Keywords :
electric sensing devices; piezoelectric transducers; strain measurement; thick film resistors; applied strain; longitudinal gauge factors; piezoresistive effects; strain sensing applications; thick film resistors; transverse gauge factors; Capacitive sensors; Electrical resistance measurement; Hysteresis; Performance evaluation; Piezoresistance; Resistors; Strain measurement; Substrates; Thick films; Thickness measurement;
Conference_Titel :
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location :
Columbia, SC
DOI :
10.1109/SECON.1989.132392
