Memory Based Analogue Signal Generation Implementation Issues for BIST

Author

Shea, T.O. ; Grout, I. ; Ryan, J.

Author_Institution

Univ. of Limerick, Limerick

fYear

2007

fDate

11-13 April 2007

Firstpage

1

Lastpage

6

Abstract

An analogue signal generated from a periodically reproduced bitstream pattern from a SigmaDelta modulator output can be used in the testing of mixed-signal devices. This paper discusses an ASIC design which examines the implementation issues and design considerations of single and multi-bit quantizers in memory based analogue signal generation. Special emphasis is placed on multi-bit signal generation in which two methods are explored to overcome the linearity issues associated with multi-bit DACs, without the requirement of additional silicon area.

Keywords

application specific integrated circuits; built-in self test; logic design; sigma-delta modulation; ASIC design; BIST; SigmaDelta modulator; memory based analogue signal generation; mixed-signal devices testing; multi bit quantizers; single bit quantizers; Application specific integrated circuits; Built-in self-test; Circuit testing; Frequency; Pulse modulation; Signal design; Signal generators; Switches; Test pattern generators; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Diagnostics of Electronic Circuits and Systems, 2007. DDECS '07. IEEE

Conference_Location

Krakow

Print_ISBN

1-4244-1162-9

Electronic_ISBN

1-4244-1162-9

Type

conf

DOI

10.1109/DDECS.2007.4295321

Filename

4295321