Title :
ESD Failures of Integrated Circuits and Their Diagnostics Using Transmission Line Pulsing
Author :
Piatek, Z. ; Kolodziejski, J.F. ; Pleskacz, W.A.
Author_Institution :
Warsaw Univ. of Technol., Warsaw
Abstract :
In the work typical ESD failures of integrated circuits and ESD testing methods are presented. Authors describe dependencies between ESD models and different ESD failures. In order to allow more advanced ESD testing of integrated circuits, transmission line pulsing is proposed and its correlation to HBM method described. Finally conclusions based on up-to-date research and test results obtained with the help of the assembled TLP tester are provided.
Keywords :
electrostatic discharge; fault diagnosis; integrated circuit reliability; integrated circuit testing; transmission line theory; electrostatic discharge failure diagnostic; electrostatic discharge testing methods; human body model method; integrated circuits; transmission line pulsing; Biological system modeling; Circuit testing; Distributed parameter circuits; Electrons; Electrostatic discharge; Integrated circuit interconnections; Integrated circuit technology; Predictive models; Protection; Semiconductor devices;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and Systems, 2007. DDECS '07. IEEE
Conference_Location :
Krakow
Print_ISBN :
1-4244-1162-9
Electronic_ISBN :
1-4244-1162-9
DOI :
10.1109/DDECS.2007.4295323
