• DocumentCode
    3314921
  • Title

    Reliability and Life Prediction for electronic connectors for control applications

  • Author

    Varde, P.V. ; Agarwal, M. ; Marathe, P.P. ; Mohapatra, U. ; Sharma, R.C. ; Naikan, V.N.A.

  • Author_Institution
    Bhabha Atomic Res. Centre, Mumbai, India
  • fYear
    2010
  • fDate
    14-16 Dec. 2010
  • Firstpage
    63
  • Lastpage
    67
  • Abstract
    This paper presents the application of Life testing methods for Life and Reliability Prediction of new components. The procedure developed for this work can be adopted for testing of any components by incorporating component specific changes. There are two major feature of this work. First, the emphasis of this work was to take life testing methods to understand the physics-of-failure of the components by extending the life testing methods to further statistical analysis and micro-structural examination. Second, to make the testing process more effective and efficient, the test specifications have been worked out using Design of Experiment method.
  • Keywords
    design of experiments; electronic equipment testing; life testing; components testing; control applications; design of experiment method; electronic connectors; life prediction; life testing methods; microstructural examination; reliability; statistical analysis; Corrosion; Humidity; Instruments; Stress; Temperature measurement; Testing; Uncertainty; Electronic connectors; Life & Reliability Prediction; Life Testing and Physics-of-Failure Methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability, Safety and Hazard (ICRESH), 2010 2nd International Conference on
  • Conference_Location
    Mumbai
  • Print_ISBN
    978-1-4244-8344-0
  • Type

    conf

  • DOI
    10.1109/ICRESH.2010.5779634
  • Filename
    5779634