DocumentCode
3314921
Title
Reliability and Life Prediction for electronic connectors for control applications
Author
Varde, P.V. ; Agarwal, M. ; Marathe, P.P. ; Mohapatra, U. ; Sharma, R.C. ; Naikan, V.N.A.
Author_Institution
Bhabha Atomic Res. Centre, Mumbai, India
fYear
2010
fDate
14-16 Dec. 2010
Firstpage
63
Lastpage
67
Abstract
This paper presents the application of Life testing methods for Life and Reliability Prediction of new components. The procedure developed for this work can be adopted for testing of any components by incorporating component specific changes. There are two major feature of this work. First, the emphasis of this work was to take life testing methods to understand the physics-of-failure of the components by extending the life testing methods to further statistical analysis and micro-structural examination. Second, to make the testing process more effective and efficient, the test specifications have been worked out using Design of Experiment method.
Keywords
design of experiments; electronic equipment testing; life testing; components testing; control applications; design of experiment method; electronic connectors; life prediction; life testing methods; microstructural examination; reliability; statistical analysis; Corrosion; Humidity; Instruments; Stress; Temperature measurement; Testing; Uncertainty; Electronic connectors; Life & Reliability Prediction; Life Testing and Physics-of-Failure Methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability, Safety and Hazard (ICRESH), 2010 2nd International Conference on
Conference_Location
Mumbai
Print_ISBN
978-1-4244-8344-0
Type
conf
DOI
10.1109/ICRESH.2010.5779634
Filename
5779634
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