DocumentCode :
3314996
Title :
TTTC: Test Technology Technical Council
fYear :
2007
fDate :
11-13 April 2007
Abstract :
Provides a listing of current committee members and society officers.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits and Systems, 2007. DDECS '07. IEEE
Conference_Location :
Krakow
Print_ISBN :
1-4244-1161-0
Type :
conf
DOI :
10.1109/DDECS.2007.4295327
Filename :
4295327
Link To Document :
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