DocumentCode
3315053
Title
Dielectric related effects in micromachined electrostatic actuators
Author
Cabuz, Cleo
Author_Institution
Honeywell Technol. Center, Plymouth, MN, USA
fYear
1999
fDate
1999
Firstpage
327
Abstract
The paper discusses the advantages of using electrostatic actuation at the microscale and the issues associated with the use of narrow air gaps (hundreds of Angstroms to hundreds of microns), thin dielectric films (few thousands of Angstroms) and very high fields (over 2 MV/cm) in microdevices. The attention is focused on the touch-mode electrostatic actuators. Studies on the effect of the dielectric and electrode material, of the ambient humidity and gas, of the driving signal and the operating mode are reported. The failure modes are identified and some solutions are given. Electrostatic microactuators operating without failures for over 40 million cycles are reported. Areas of further study are identified. The paper serves as an invitation to the members of the DEI Society to join the efforts of the MEMS community in the study and development of micro-and meso-scale electrostatic actuators
Keywords
air gaps; dielectric thin films; electrostatic actuators; MEMS; ambient humidity; driving signal; failure modes; high fields; micromachined electrostatic actuators; narrow air gaps; operating mode; thin dielectric films; touch-mode actuators; Atmosphere; Conducting materials; Dielectrics; Electrodes; Electromagnetic forces; Electrostatic actuators; Fasteners; Inorganic materials; Microactuators; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1999 Annual Report Conference on
Conference_Location
Austin, TX
Print_ISBN
0-7803-5414-1
Type
conf
DOI
10.1109/CEIDP.1999.804655
Filename
804655
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