DocumentCode :
3315229
Title :
Application of Clustering Methods for Analysing of TTCN-3 Test Data Quality
Author :
Vega, Diana ; Din, George ; Taranu, Stefan ; Schieferdecker, Ina
Author_Institution :
Tech. Univ. of Berlin, Berlin
fYear :
2008
fDate :
26-31 Oct. 2008
Firstpage :
237
Lastpage :
244
Abstract :
The use of the standardised testing notation, testing and test control notation (TTCN-3) language has increased continuously over the last years. Many test suites of large sizes covering different domains exist. Therefore, it becomes important to provide the TTCN-3 community with methods and tools to evaluate the quality of tests. This paper presents the idea of evaluating the quality of the test data stimuli by using a data clustering method and measuring the coverage related to data clusters. A cluster contains stimuli which are considered similar for the system under test (SUT) behaviour; that means that each stimuli within a cluster should provide similar results from the test point of view.
Keywords :
authoring languages; conformance testing; pattern clustering; SUT behaviour; TTCN-3 test data quality; data clustering method; test control notation language; testing notation; Application software; Clustering methods; Concrete; Dictionaries; ISO standards; Runtime; Sampling methods; Software engineering; Software testing; System testing; TTCN-3; coverage; data clustering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering Advances, 2008. ICSEA '08. The Third International Conference on
Conference_Location :
Sliema
Print_ISBN :
978-1-4244-3218-9
Electronic_ISBN :
978-0-7695-3372-8
Type :
conf
DOI :
10.1109/ICSEA.2008.44
Filename :
4668114
Link To Document :
بازگشت