Title :
Simulation of predischarge processes in SF6/N2 mixtures stressed by very fast transient voltages
Author :
Pfeiffer, W. ; Schoen, D. ; Tong, L.Z.
Author_Institution :
Darmstadt Univ. of Technol., Germany
Abstract :
This paper deals with the numerical simulation of discharge processes in SF6/N2 mixtures. We introduce the particle-in-cell (PIC) method using a Monte Carlo collision module (MCC) applied to a two dimensional model of an inhomogeneous gap configuration. Calculation of the electrical field and the spatial distribution of electrons and ions in pure SF6 and in 10% SF 6/N2 gas mixtures for this configuration were carried out for an total time of 5 ns after applying the test voltage. Eight particle collision types including electron-ion impact and photoionisation have been considered
Keywords :
Monte Carlo methods; SF6 insulation; discharges (electric); electron impact ionisation; gas mixtures; nitrogen; photoionisation; plasma simulation; sulphur compounds; Monte Carlo collision module; SF6-N2; SF6/N2 mixtures; discharge processes; electrical field; electron spatial distribution; electron-ion impact; inhomogeneous gap configuration; ion spatial distribution; numerical simulation; particle collision types; particle-in-cell method; photoionisation; predischarge processes; two dimensional model; very fast transient voltages; Electrons; Equations; Gas insulated transmission lines; Gas insulation; Ionization; Mesh generation; Numerical simulation; Particle collisions; Testing; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1999 Annual Report Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-5414-1
DOI :
10.1109/CEIDP.1999.804670
