DocumentCode
3315615
Title
Irregular sampling, active observability, and convergence rates of state observers for systems with binary-valued observations
Author
Li, Chanying ; Wang, Le Yi ; Yin, G. George ; Guo, Yin Lei ; Xu, Cheng-Zhong
Author_Institution
ECE Dept., Wayne State Univ., Detroit, MI, USA
fYear
2009
fDate
15-18 Dec. 2009
Firstpage
8506
Lastpage
8511
Abstract
This paper is concerned with state observer design of systems with binary-valued output measurements. First, observability of sampled systems is obtained under noise-free observations and arbitrary sampling times. It demonstrates that if the original system is observable, the sampled system is always observable whenever sampling density is larger than some critical frequency, independent of the actual time sequences. This result is then used to design switching time sequences and deduce active observability for systems with binary-valued output observations. Convergence of state estimates relies on some persistent excitation conditions that are usually required to hold. When observations become noise corrupted it is shown that by designing suitable switching time sequences certain convergence rates can always be obtained, which are explicitly derived.
Keywords
convergence; observability; observers; sampled data systems; sequences; active observability; binary valued observations; binary valued output measurements; binary-valued output observations; convergence rates; critical frequency; irregular sampling; persistent excitation conditions; sampled systems; sampling density; state estimates; state observer design; state observers; time sequences; Active noise reduction; Convergence; Eigenvalues and eigenfunctions; Frequency synchronization; MIMO; Mathematics; Observability; Sampling methods; Signal resolution; State estimation; Observability; binary-valued observation; sampled system;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
Conference_Location
Shanghai
ISSN
0191-2216
Print_ISBN
978-1-4244-3871-6
Electronic_ISBN
0191-2216
Type
conf
DOI
10.1109/CDC.2009.5400763
Filename
5400763
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